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Volumn 69, Issue 4, 2007, Pages 514-525

A study of the SiO2-aqueous electrolyte (NaCl, CsCl) interface by X-ray photoelectron spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CESIUM COMPOUNDS; ELECTROLYTES; IONIC STRENGTH; PH; SODIUM CHLORIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 34547893792     PISSN: 1061933X     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1061933X0704014X     Document Type: Article
Times cited : (12)

References (19)
  • 6
    • 34547921794 scopus 로고    scopus 로고
    • Rosenquist, J., PhD Thesis (Umeä Univ., 2002).
    • (2002)
    • Rosenquist, J.1
  • 7
    • 34547898562 scopus 로고    scopus 로고
    • CasaXPS, Ver. 2.1, Casa Software, http://www.casaxps.com.
    • CasaXPS, Ver. 2.1
  • 17


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.