Using Minimum Quantization Error chart for the monitoring of process states in multivariate manufacturing processes

Computers and Industrial Engineering

Volumn 57, Issue 4, 2009, Pages 1300-1312

  Yu, Jian Bo ^a   Wang, Shijin ^b  

^a SHANGHAI UNIVERSITY   (China)

^b TONGJI UNIVERSITY   (China)

Author keywords

Input features; Manufacturing process monitoring; Multivariate manufacturing process control; Self Organizing Map; Statistical process control

Indexed keywords

ABNORMAL PATTERNS; BATCH MANUFACTURING; BIVARIATE; INPUT FEATURES; MANUFACTURING PROCESS; MINIMUM QUANTIZATION ERRORS; MONITORING AND ANALYSIS; MONITORING PROCESS; MULTIVARIATE MANUFACTURING PROCESS; MULTIVARIATE STATISTICAL PROCESS CONTROL; NOISE TOLERANCE; PROCESS STATE; QUANTITATIVE ASSESSMENTS; REAL TIME; SEVERAL VARIABLES; STATISTICAL DISTRIBUTION;

CONFORMAL MAPPING; INDUSTRIAL ENGINEERING; MULTIVARIANT ANALYSIS; NEURAL NETWORKS; PROCESS MONITORING; PRODUCTION ENGINEERING; QUALITY CONTROL; SURFACE TREATMENT; TIME SERIES;

STATISTICAL PROCESS CONTROL;

EID: 71849108091     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cie.2009.06.009     Document Type: Article

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