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Volumn 312, Issue 2, 2010, Pages 202-208
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Some physical investigations on ZnS1-xSex films obtained by selenization of ZnS sprayed films using the Boubaker polynomials expansion scheme
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Author keywords
A1. Boubaker polynomials expansion scheme; A1. Phtothermal protocol; A1. Surface structure; A1. X ray diffraction; A3. Chemical vapor deposition process; B2. Semiconducting II VI materials
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Indexed keywords
A1. BOUBAKER POLYNOMIALS EXPANSION SCHEME;
BAND GAP ENERGY;
CHEMICAL VAPOR DEPOSITION PROCESS;
CUBIC STRUCTURE;
OPTICAL MEASUREMENT;
PHOTO-THERMAL;
POLYNOMIALS EXPANSION;
PYREX GLASS;
SELENIZATION;
SEMICONDUCTING II-VI MATERIALS;
STRUCTURAL STUDIES;
SUBSTRATE TEMPERATURE;
THERMAL AND MECHANICAL PROPERTIES;
VICKERS HARDNESS MEASUREMENTS;
XRD TECHNIQUE;
ZNS THIN FILMS;
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
CRYSTAL ATOMIC STRUCTURE;
DIFFRACTION;
MEASUREMENTS;
MECHANICAL PROPERTIES;
OPTICAL DATA PROCESSING;
POLYNOMIALS;
SELENIUM;
SUBSTRATES;
SURFACE MORPHOLOGY;
SURFACES;
THIN FILMS;
VICKERS HARDNESS;
X RAY DIFFRACTION;
ZINC SULFIDE;
SEMICONDUCTING SELENIUM COMPOUNDS;
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EID: 71649090316
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2009.10.039 Document Type: Article |
Times cited : (13)
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References (27)
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