Structure and morphology of sprayed ZnS thin films

Physica Status Solidi (A) Applied Research

Volumn 201, Issue 14, 2004, Pages 3070-3076

  Ben Nasrallah, T ^a   Amlouk, M ^a   Bernede J C ^b   Belgacem, S ^a  

^a FACULTÉ DES SCIENCES DE TUNIS   (Tunisia)

^b Laboratoire de Physique des Solides Pour l'Electronique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; MORPHOLOGY; PYROLYSIS; THIN FILMS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ANNEALING TEMPERATURE; BUFFER LAYERS; SPRAY PYROLYSIS; SURFACE CONTAMINATION;

ZINC SULFIDE;

EID: 10944245664     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200406872     Document Type: Article

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