Analyses of accelerated life test data under two failure modes

International Journal of Reliability, Quality and Safety Engineering

Volumn 9, Issue 2, 2002, Pages 111-125

  Kim, C M ^a   Bai, D S ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Accelerated life test; Expectation and maximization algorithm; Intrinsic and extrinsic failures; Maximum likelihood; Missing variable

Indexed keywords

ALGORITHMS; DURABILITY; FAILURE ANALYSIS; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; STRESS CONCENTRATION; WEIBULL DISTRIBUTION;

ACCELERATED LIFE TEST; EXTRINSIC FAILURE; INTRINSIC FAILURE; LIFETIME DISTRIBUTION;

RELIABILITY;

EID: 0036362192     PISSN: 02185393     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218539302000706     Document Type: Article

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