메뉴 건너뛰기




Volumn 1, Issue 1, 2009, Pages 839-842

All-Oxide Crystalline Microelectromechanical systems

Author keywords

MEMS; Strain; Strain device; Transition metal Oxide

Indexed keywords

APPLIED STRAIN; CRYSTALLINE OXIDES; FLEXIBLE SUBSTRATE; MICRO ELECTRO MECHANICAL SYSTEM; MICRO-CANTILEVERS; MICROELECTROMECHANICAL SYSTEMS; SRTIO; TRANSITION METAL OXIDE; TRANSITION-METAL OXIDES; TRIANGULAR GEOMETRY; UPPER SURFACE;

EID: 71549154673     PISSN: 18766196     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.proche.2009.07.209     Document Type: Conference Paper
Times cited : (7)

References (13)
  • 1
    • 49649104786 scopus 로고    scopus 로고
    • A Thin Film Approach to Engineering Functionality into Oxides
    • Schlom D.G., et al. A Thin Film Approach to Engineering Functionality into Oxides. J. Am. Ceram. Soc. 91 (2008) 2429-2454
    • (2008) J. Am. Ceram. Soc. , vol.91 , pp. 2429-2454
    • Schlom, D.G.1
  • 2
    • 0042916408 scopus 로고    scopus 로고
    • Electric field effect in correlated oxide systems
    • Ahn C.H., Triscone J.-M., and Mannhart J. Electric field effect in correlated oxide systems. Nature 424 (2003) 1015
    • (2003) Nature , vol.424 , pp. 1015
    • Ahn, C.H.1    Triscone, J.-M.2    Mannhart, J.3
  • 3
    • 0346846578 scopus 로고    scopus 로고
    • Reversible shift of the transition temperature of manganites in planar field-effect devices patterned by atomic force microscope
    • Pallecchi I., Pellegrino L., Bellingeri E., Siri A.S., and Marré D. Reversible shift of the transition temperature of manganites in planar field-effect devices patterned by atomic force microscope. Appl. Phys. Lett. 83 (2003) 4435-4437
    • (2003) Appl. Phys. Lett. , vol.83 , pp. 4435-4437
    • Pallecchi, I.1    Pellegrino, L.2    Bellingeri, E.3    Siri, A.S.4    Marré, D.5
  • 6
    • 0000751085 scopus 로고    scopus 로고
    • suspended epitaxial YbaCuO microbolometers fabrciated by silicon micromachining : modeling and measurements
    • Méchin L., Villégier J.-C., and Bloyet D. suspended epitaxial YbaCuO microbolometers fabrciated by silicon micromachining : modeling and measurements. J. Appl. Phys. 81 (1997) 7039
    • (1997) J. Appl. Phys. , vol.81 , pp. 7039
    • Méchin, L.1    Villégier, J.-C.2    Bloyet, D.3
  • 7
    • 24144441232 scopus 로고    scopus 로고
    • 3 membrane on Si for uncooled infrared microbolometer
    • 3 membrane on Si for uncooled infrared microbolometer. Appl. Phys. Lett. 87 (2005) 033502
    • (2005) Appl. Phys. Lett. , vol.87 , pp. 033502
    • Kim, J.H.1    Grishin, A.M.2
  • 10
    • 71549114604 scopus 로고    scopus 로고
    • Patent ITA TO2008A000257, EU
    • patent application 09156790.9, 1528
    • L. Pellegrino, M. Biasotti, A. S. Siri, Patent ITA TO2008A000257, EU patent application 09156790.9 - 1528
    • Pellegrino, L.1    Biasotti, M.2    Siri, A.S.3
  • 11
    • 67649389931 scopus 로고    scopus 로고
    • All-oxide crystalline micro-electromechanical systems: bending the functionalities of transition-metal oxide thin films
    • Pellegrino L., Biasotti M., Bellingeri E., Bernini C., Siri A.S., and Marrè D. All-oxide crystalline micro-electromechanical systems: bending the functionalities of transition-metal oxide thin films. Adv. Mater. 21 (2009) 2377-2381
    • (2009) Adv. Mater. , vol.21 , pp. 2377-2381
    • Pellegrino, L.1    Biasotti, M.2    Bellingeri, E.3    Bernini, C.4    Siri, A.S.5    Marrè, D.6
  • 12
    • 71549122353 scopus 로고    scopus 로고
    • Comsol Multiphysics version 3.4
    • Comsol Multiphysics version 3.4
  • 13
    • 37349006548 scopus 로고    scopus 로고
    • Elastic and orbital effects on thickness-dependent properties of manganite thin films
    • Infante I.C., et al. Elastic and orbital effects on thickness-dependent properties of manganite thin films. Phys. Rev. B 76 (2007) 224415
    • (2007) Phys. Rev. B , vol.76 , pp. 224415
    • Infante, I.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.