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Volumn 3, Issue 6, 2009, Pages 175-177
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Probing disorder and charged impurities in graphene by Raman spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
AMBIENT CONDITIONS;
CHARGE CONCENTRATION;
CHARGED IMPURITY;
GRAPHENES;
RAMAN PARAMETERS;
RAMAN SPECTRA;
SUBMICRON SCALE;
THIN SILICON OXIDE;
DOPING (ADDITIVES);
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SILICON COMPOUNDS;
SILICON OXIDES;
GRAPHITE;
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EID: 71149088512
PISSN: 18626254
EISSN: 18626270
Source Type: Journal
DOI: 10.1002/pssr.200903135 Document Type: Article |
Times cited : (111)
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References (30)
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