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Volumn , Issue , 2009, Pages

Low-refractive-index materials - A new class of optical thin-film materials

Author keywords

[No Author keywords available]

Indexed keywords

INDEX MATERIAL; INDEX RANGE; LOW-REFRACTIVE-INDEX MATERIALS; THIN FILM MATERIAL;

EID: 71049146761     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (6)
  • 3
    • 34248332216 scopus 로고    scopus 로고
    • Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection
    • March
    • J.-Q. Xi, Martin F. Schubert, J. K. Kim, E. Fred Schubert, Minfeng Chen, Shawn-Yu Lin, Wayne Liu, and Joe A. Smart "Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection" Nature Photonics 1, 176 (March 2007)
    • (2007) Nature Photonics , vol.1 , pp. 176
    • Xi, J.-Q.1    Schubert, M.F.2    Kim, J.K.3    Fred Schubert, E.4    Chen, M.5    Lin, S.-Y.6    Liu, W.7    Smart, J.A.8
  • 4
    • 34047256843 scopus 로고    scopus 로고
    • Martin. F. Schubert, J.-Q. Xi, J. K. Kim, and E. F Schubert Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material Applied Physics Letters 90, 141115 (April 2007)
    • Martin. F. Schubert, J.-Q. Xi, J. K. Kim, and E. F Schubert "Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material" Applied Physics Letters 90, 141115 (April 2007)
  • 5
    • 52649176750 scopus 로고    scopus 로고
    • Light-extraction enhancement of GaInN light-emitting diodes by graded-refractive-index indium tin oxide anti-reflection contact
    • March
    • Jong Kyu Kim, S. Chhajed, M. F. Schubert, E. F. Schubert, A. J. Fischer, M. H. Crawford, J. Cho, H. Kim, and C. Sone "Light-extraction enhancement of GaInN light-emitting diodes by graded-refractive-index indium tin oxide anti-reflection contact" Advanced Materials 20, 801 (March 2008)
    • (2008) Advanced Materials , vol.20 , pp. 801
    • Kyu Kim, J.1    Chhajed, S.2    Schubert, M.F.3    Schubert, E.F.4    Fischer, A.J.5    Crawford, M.H.6    Cho, J.7    Kim, H.8    Sone, C.9
  • 6
    • 71049193071 scopus 로고    scopus 로고
    • Quantification of porosity and deposition rate of nano-porous films grown by oblique angle deposition
    • submitted for publication August
    • David J. Poxson, Frank W. Mont, Martin F. Schubert, Jong Kyu Kim, and E. Fred Schubert "Quantification of porosity and deposition rate of nano-porous films grown by oblique angle deposition" submitted for publication (August 2008)
    • (2008)
    • Poxson, D.J.1    Mont, F.W.2    Schubert, M.F.3    Kyu Kim, J.4    Fred Schubert, E.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.