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1
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20944447835
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2 as a low-refractive-index material
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June
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2 as a low-refractive-index material" Optics Letters 30, 1518 (June 2005)
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(2005)
Optics Letters
, vol.30
, pp. 1518
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Xi, J.-Q.1
Ojha, M.2
Cho, W.3
Plawsky, J.L.4
Gill, W.N.5
Gessmann, T.6
Schubert, E.F.7
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2
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24144485860
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Internal high-reflectivity omni-directional reflectors
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July
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J.-Q.Xi, M. Ojha, J. L. Plawsky, W. N. Gill, J. K. Kim, and E. F. Schubert "Internal high-reflectivity omni-directional reflectors" Applied Physics Letters 87, 031111 (July 2005)
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(2005)
Applied Physics Letters
, vol.87
, pp. 031111
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Xi, J.Q.1
Ojha, M.2
Plawsky, J.L.3
Gill, W.N.4
Kim, J.K.5
Schubert, E.F.6
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3
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34248332216
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Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection
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March
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J.-Q. Xi, Martin F. Schubert, J. K. Kim, E. Fred Schubert, Minfeng Chen, Shawn-Yu Lin, Wayne Liu, and Joe A. Smart "Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection" Nature Photonics 1, 176 (March 2007)
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(2007)
Nature Photonics
, vol.1
, pp. 176
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Xi, J.-Q.1
Schubert, M.F.2
Kim, J.K.3
Fred Schubert, E.4
Chen, M.5
Lin, S.-Y.6
Liu, W.7
Smart, J.A.8
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4
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34047256843
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Martin. F. Schubert, J.-Q. Xi, J. K. Kim, and E. F Schubert Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material Applied Physics Letters 90, 141115 (April 2007)
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Martin. F. Schubert, J.-Q. Xi, J. K. Kim, and E. F Schubert "Distributed Bragg reflector consisting of high- and low-refractive-index thin film layers made of the same material" Applied Physics Letters 90, 141115 (April 2007)
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5
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52649176750
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Light-extraction enhancement of GaInN light-emitting diodes by graded-refractive-index indium tin oxide anti-reflection contact
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March
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Jong Kyu Kim, S. Chhajed, M. F. Schubert, E. F. Schubert, A. J. Fischer, M. H. Crawford, J. Cho, H. Kim, and C. Sone "Light-extraction enhancement of GaInN light-emitting diodes by graded-refractive-index indium tin oxide anti-reflection contact" Advanced Materials 20, 801 (March 2008)
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(2008)
Advanced Materials
, vol.20
, pp. 801
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Kyu Kim, J.1
Chhajed, S.2
Schubert, M.F.3
Schubert, E.F.4
Fischer, A.J.5
Crawford, M.H.6
Cho, J.7
Kim, H.8
Sone, C.9
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6
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71049193071
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Quantification of porosity and deposition rate of nano-porous films grown by oblique angle deposition
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submitted for publication August
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David J. Poxson, Frank W. Mont, Martin F. Schubert, Jong Kyu Kim, and E. Fred Schubert "Quantification of porosity and deposition rate of nano-porous films grown by oblique angle deposition" submitted for publication (August 2008)
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(2008)
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Poxson, D.J.1
Mont, F.W.2
Schubert, M.F.3
Kyu Kim, J.4
Fred Schubert, E.5
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