Fabrication and characterization of a Ni-Mn-Ga uniaxially textured freestanding film deposited by DC magnetron sputtering

Journal of Alloys and Compounds

Volumn 489, Issue 2, 2010, Pages 509-514

  Tillier, J ^a   Bourgault, D ^a   Barbara, B ^a   Pairis, S ^a   Porcar, L ^a   Chometon, P ^a   Dufeu, D ^a   Caillault, N ^b   Carbone, L ^b  

^a CNRS   (France)

^b SCHNEIDER ELECTRIC   (France)

Author keywords

DC magnetron sputtering; Freestanding Ni Mn Ga thick film; Martensitic transformation; Shape memory effect

Indexed keywords

ANNEALED FILMS; AUSTENITE PHASE; DC MAGNETRON SPUTTERING; DIRECT CURRENT MAGNETRON SPUTTERING; EXPERIMENTAL DATA; FERROMAGNETIC BEHAVIORS; FREESTANDING FILMS; FREESTANDING NI-MN-GA THICK FILM; IN-SITU MEASUREMENT; MAGNETIZATION PROCESS; MARTENSITIC TRANSITIONS; MASS FRACTION; MODEL-BASED; NI-MN-GA; OUT-OF-PLANE TEXTURES; POLYCRYSTALLINE FILM; RESISTANCE TEMPERATURE; SACRIFICIAL LAYER; TARGET COMPOSITION;

ANNEALING; AUSTENITE; CURIE TEMPERATURE; GALLIUM; MAGNETIC PROPERTIES; MAGNETRON SPUTTERING; MAGNETRONS; MAGNETS; MANGANESE; MANGANESE COMPOUNDS; MARTENSITE; NICKEL; OPTICAL MICROSCOPY; SATURATION MAGNETIZATION; SCANNING ELECTRON MICROSCOPY; SHAPE MEMORY EFFECT; STOICHIOMETRY; THICK FILMS; WEAR RESISTANCE;

MARTENSITIC TRANSFORMATIONS;

EID: 70649099127     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.09.096     Document Type: Article

References (29)

1. Söderberg O., Ge Y., Sozinov A., Hannula S.-P., and Lindroos V.K. Smart Mater. Struct. 14 (2005) 223
2. Söderberg O., Aaltio I., Ge Y., Heczko O., and Hannula S.-P. Mater. Sci. Eng. A 481-482 (2008) 80
3. Winzek B., Schmitz S., Rumpf H., Sterzl T., Hassdorf R., Thienhaus S., Feydt J., Moske M., and Quandt E. Mater. Sci. Eng. A 378 (2004) 40
4. Chernenko V.A., and Besseghini S. Sens. Actuators A 142 (2008) 542
5. Ullakko K., Huang J.K., Kantner C., O'Handley R.C., and Kokorin V.V. Appl. Phys. Lett. 69 (1996) 1966
6. Likhachev A.A., and Ullakko K. Phys. Lett. A 275 (2000) 142
7. Murray S.J., Marioni M., Allen S.M., O'Handley R.C., and Lograsso T.A. Appl. Phys. Lett. 77 (2000) 886
8. Heczko O., Sozinov A., and Ullakko K. IEEE Trans. Magn. 32 (2000) 3266
9. James R.D., Tickle R., and Wuttig M. Mater. Sci. Eng. A 273-275 (1999) 320
10. Sozinov A., Likhachev A.A., Lanska N., and Ullakko K. Appl. Phys. Lett. 80 (2002) 1746
11. Müllner P., Chernenko V.A., and Korstorz G. J. Appl. Phys. 95 (2004) 1531
12. Xu H.B., Li Y., and Jiang C.B. Mater. Sci. Eng. A 438-440 (2006) 1065
13. Dong J.W., Xie J.Q., Lu J., Adelmann C., Palmstrom C.J., Cui J., Pan Q., Shield T.W., James R.D., and McKernan S. J. Appl. Phys. 95 (2004) 2593
14. Chernenko V.A., Besseghini S., Hagler M., Müllner P., Ohtsuka M., and Stortiero F. Mater. Sci. Eng. A 481-482 (2008) 271
15. Ohtsuka M., Matsumoto M., and Itagaki K. J. Intell. Mater. Syst. Struct. 17 (2006) 1069
16. Kohl M., Brugger D., Ohtsuka M., and Takagi T. Sens. Actuators A 114 (2004) 445
17. Besseghini S., Gambardella A., Chernenko V.A., Hagler M., Pohl C., Müllner P., Ohtsuka M., and Doyle S. Eur. Phys. J. Special Top. 158 (2008) 179
18. Chernenko V., Kohl M., Doyle S., Müllner P., and Ohtsuka M. Scripta Mater. 54 (2006) 1287
19. Jakob G., and Elmers H.J. J. Magn. Magn. Mater. 310 (2007) 2779
20. Thomas M., Heczko O., Buschbeck J., Schultz L., and Fähler S. Appl. Phys. Lett. 95 (2008) 192515
21. Khelfaoui F., Kohl M., Buschbeck J., Heczko O., Fähler S., and Schultz L. Eur. Phys. J. Special Top. 158 (2008) 167
22. Heczko O., Thomas M., Buschbeck J., Schultz L., and Fähler S. Appl. Phys. Lett. 92 (2008) 072502
23. Tello P.G., Castano F.J., O'Handley R.C., Allen S.M., Esteve M., Labarta A., and Batlle X. J. Appl. Phys. 91 (2002) 8234
24. Hakola A., Heczko O., Jaakkola A., Kajava T., and Ullakko K. Appl. Surf. Sci. 238 (2004) 155
25. Villaume A., Antonevici A., Bourgault D., Leggeri J.P., Porcar L., and Villard C. Rev. Sci. Instrum. 79 (2008) 023904
26. Chernenko V.A. Scripta Mater. 40 (1999) 523
27. Marcos J., Manosa L., Planes A., Casanova F., Batlle X., and Labarta A. Phys. Rev. B 68 (2003) 094401
28. Moya X., Manosa L., Planes A., Krenke T., Acet M., and Wassermann E. Mater. Sci. Eng. A 438-440 (2006) 911-915
29. Chernenko V.A., L'vov V.A., Müllner P., Kostorz G., and Takagi T. Phys. Rev. B 69 (2004) 134410