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Volumn , Issue , 2009, Pages

High speed I/O and thermal effect characterization of 3D stacked ICs

Author keywords

3D technology; CML; Crosstalk; GTL driver; High speed design; I O; ISI; Signal integrity; Stacked ICs

Indexed keywords

3D TECHNOLOGY; CMOS TECHNOLOGY; CONTROL LOGIC; DATA PATTERNS; DIFFERENT FREQUENCY; DIFFERENTIAL SIGNAL; ELECTRICAL MODELS; EYE DIAGRAMS; HIGH CURRENTS; HIGH SPEED DESIGNS; HIGH SPEED I/O; HIGH-SPEED SIGNALS; I/O DRIVERS; ON CHIPS; SIGNAL INTEGRITY; SPEED DIFFERENTIAL; SYSTEM IMPLEMENTATION; THERMAL PERFORMANCE; THROUGH SILICON VIAS; TRANSIENT SIMULATION; WORK FOCUS;

EID: 70549105981     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/3DIC.2009.5306528     Document Type: Conference Paper
Times cited : (5)

References (11)
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    • Val, C.1
  • 3
    • 7244223011 scopus 로고
    • MCM interconnection options
    • Anaheim, CA
    • Freedam, M., "MCM interconnection options", Proc NEPCON West, Anaheim, CA, 1991, p. 1527
    • (1991) Proc NEPCON West , pp. 1527
    • Freedam, M.1
  • 7
    • 0002512395 scopus 로고    scopus 로고
    • B. A. Chappell, T. I. Chappell, S. E. Schuster, H.M. Segmuller, J.W. Allan, R.L. Franch, and P.J. Restle, Fast CMOS ECL Receivers With 100-mV , Worst-Case Sensitivity, IEEE Journal of Solid-State Circuits, vol23, no.1, pp. 59-67, February 1988.
    • B. A. Chappell, T. I. Chappell, S. E. Schuster, H.M. Segmuller, J.W. Allan, R.L. Franch, and P.J. Restle, "Fast CMOS ECL Receivers With 100-mV ," Worst-Case Sensitivity," IEEE Journal of Solid-State Circuits, vol23, no.1, pp. 59-67, February 1988.
  • 9
    • 0036287194 scopus 로고    scopus 로고
    • ISCAS 2002. IEEE International Symposium on Volume 2
    • 26-29 May 2002 Page(s):II-149, II-152
    • Filanovsky, I.M.; Su Tam Lim, "Temperature sensor applications of diode-connected MOS transistors," ISCAS 2002. IEEE International Symposium on Volume 2, 26-29 May 2002 Page(s):II-149 - II-152 vol. 2.
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    • Filanovsky, I.M.1    Su, T.2
  • 10
    • 0030242407 scopus 로고    scopus 로고
    • Szajda, K.S.; Sodini, C.G.; Bowman, H.F., Low noise, high resolution silicon temperature sensor, Solid-State Circuits, IEEE Journal of, 31, Issue 9, Sept. 1996 Page(s):1308 - 1313.
    • Szajda, K.S.; Sodini, C.G.; Bowman, H.F., "Low noise, high resolution silicon temperature sensor," Solid-State Circuits, IEEE Journal of, Volume 31, Issue 9, Sept. 1996 Page(s):1308 - 1313.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.