A low noise, high resolution silicon temperature sensor

IEEE Journal of Solid-State Circuits

Volumn 31, Issue 9, 1996, Pages 1308-1313

  Szajda, Kenneth S ^a,b   Sodini, Charles G ^a   Bowman, H Frederick ^c  

^a Department of Electrical Engineering and Computer Science   (United States)

^b AGERE SYSTEMS   (United States)

^c HARVARD MIT DIVISION OF HEALTH SCIENCES AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BLOOD; CMOS INTEGRATED CIRCUITS; ELECTRONIC MEDICAL EQUIPMENT; FEEDBACK CONTROL; PROBES; TEMPERATURE MEASUREMENT;

BLOOD PERFUSION; HIGH RESOLUTION TEMPERATURE MEASUREMENT; INVASIVE TISSUE PROPERTY MEASUREMENT PROBE; PROPORTIONAL TO ABSOLUTE TEMPERATURE (PTAT) PRINCIPLES; SINGLE METAL MODIFIED CMOS PROCESS;

SILICON SENSORS;

EID: 0030242407     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.535415     Document Type: Article

References (9)

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