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Volumn , Issue , 2009, Pages

Electrical-thermal co-analysis for power delivery networks in 3D system integration

Author keywords

3D integration; Electrical thermal co anlysis; IR drop; Joule heating; Power delivery network (PDN); Temperature effect; Through silicon via (TSV)

Indexed keywords

3-D INTEGRATION; 3-D SYSTEM INTEGRATION; ANALYSIS METHOD; CURRENT FLOWING; ELECTRICAL ANALYSIS; ELECTRICAL RESISTIVITY; ELECTRICAL-THERMAL CO-ANLYSIS; IR DROP; JOULE HEATING EFFECT; POWER DELIVERY NETWORK; SIMULATION RESULT; TEMPERATURE DEPENDENT; TEMPERATURE EFFECTS; THERMAL ANALYSIS; THROUGH SILICON VIAS; TOOLSUITE; UNDERFILL MATERIALS;

EID: 70549098155     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/3DIC.2009.5306525     Document Type: Conference Paper
Times cited : (24)

References (7)
  • 2
    • 0031236388 scopus 로고    scopus 로고
    • Electro-thermal circuit simulation using simulator coupling
    • Sept
    • S. Wunsche, C. Clauss, P. Schwarz, F. Winkler, "Electro-thermal circuit simulation using simulator coupling," IEEE Trans. on VLSI, vol. 5, no. 3, pp 277-282, Sept. 1997.
    • (1997) IEEE Trans. on VLSI , vol.5 , Issue.3 , pp. 277-282
    • Wunsche, S.1    Clauss, C.2    Schwarz, P.3    Winkler, F.4
  • 4
    • 0017269965 scopus 로고
    • Computer simulation of integrated circuits in the presence of electrothermal interaction
    • Dec
    • K. Fukahori, P. R. Gray, "Computer simulation of integrated circuits in the presence of electrothermal interaction," IEEE Journal of Solid-State Circuits, vol. 11, no. 6, pp. 834-846, Dec. 1976.
    • (1976) IEEE Journal of Solid-State Circuits , vol.11 , Issue.6 , pp. 834-846
    • Fukahori, K.1    Gray, P.R.2
  • 7
    • 70549113153 scopus 로고    scopus 로고
    • http://www.alphaworks.ibm.com/tech/eip


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.