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Volumn , Issue , 2007, Pages 375-380
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Device level electrothermal analysis of integrated resistors
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Author keywords
Electrothermal analysis; Resistor; Thermal runaway
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Indexed keywords
ELECTRIC CONDUCTIVITY;
ELECTRIC HEATING;
ELECTRONICS INDUSTRY;
HEATING;
IMAGE SEGMENTATION;
PROCESS ENGINEERING;
RESISTORS;
THICK FILMS;
AVERAGE TEMPERATURES;
CURRENT DISTRIBUTIONS;
DISTRIBUTED NETWORKS;
ELECTRICAL CONDUCTIVITY;
ELECTRO-THERMAL COUPLING;
ELECTRO-THERMAL SIMULATIONS;
ELECTROTHERMAL ANALYSIS;
INTEGRATED RESISTORS;
INTERNATIONAL CONFERENCES;
NON UNIFORMITIES;
ORIGINAL DESIGN;
POWER DISSIPATIONS;
POWER DISTRIBUTIONS;
RESISTOR;
SELF-HEATING;
SEMI-ANALYTICAL METHODS;
TEMPERATURE-DEPENDENT;
THERMAL RESISTANCE;
THERMAL RUNAWAY;
THIN FILM RESISTORS;
INTEGRATED CIRCUITS;
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EID: 47749142103
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/MIXDES.2007.4286187 Document Type: Conference Paper |
Times cited : (6)
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References (4)
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