A new mechanism for core device failure during CDM ESD events

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 2006, Pages 8-13

  Ito, Choshu ^a   Loh, William ^a  

^a AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE FAILURES; ESD PROTECTION; ESD TEST; GATE OXIDE; I/O BUFFER; LONG LINE; MEASURED RESULTS; NETLIST; NEW MECHANISMS; ON CHIPS;

CIRCUIT SIMULATION; CONTINUUM DAMAGE MECHANICS; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; QUALITY ASSURANCE; SAFETY FACTOR;

FAILURE ANALYSIS;

EID: 70450209973     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EOSESD.2006.5256809     Document Type: Conference Paper

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