Precise XPS depth profile of soda-lime-silica glass using C60 ion beam

Journal of Non-Crystalline Solids

Volumn 356, Issue 1, 2010, Pages 14-18

  Yamamoto, Yuichi ^a   Yamamoto, Kiyoshi ^a  

^a ASAHI GLASS CO LTD   (Japan)

Author keywords

Alkali silicates; Glass ceramics; Oxide glasses; Soda lime silica; Surfaces and interfaces; UPS XPS; XPS

Indexed keywords

ALKALI SILICATES GLASS; OXIDE GLASS; SODA-LIME-SILICA; UPS/XPS; XPS;

CARBON CLUSTERS; DEPTH PROFILING; FULLERENES; FUSED SILICA; ION BOMBARDMENT; ION IMPLANTATION; IONIC CONDUCTION; LIME; OXIDES; SILICA; SILICATES; SPUTTERING; X RAY PHOTOELECTRON SPECTROSCOPY;

GLASS CERAMICS;

EID: 70450161260     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2009.09.027     Document Type: Article

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