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Volumn , Issue , 2009, Pages

Au-Sn SLID bonding: Fluxless bonding with high temperature stability, to above 350°C

Author keywords

3D integration; Au; Electroplating; Fluxless bonding; High temperature applications; Sn

Indexed keywords

3-D INTEGRATION; AU ELECTROPLATING; BOND LINE; BONDING PROCESS; CHEMICAL SURFACES; DECOMPOSITION TEMPERATURE; EDS ANALYSIS; EUTECTIC POINTS; FLUXLESS; FLUXLESS BONDING; HIGH MELTING POINT; HIGH TEMPERATURE STABILITY; INTER DIFFUSION; INTERMETALLIC COMPOUNDS; LAYERED STRUCTURES; MELTING TEMPERATURES; METAL SYSTEMS; OXIDATION RESISTANT; ROOM TEMPERATURE; SHEAR FORCE; SOLID-LIQUID;

EID: 70449926635     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (21)

References (10)
  • 1
    • 33746562819 scopus 로고    scopus 로고
    • The Basics of Wafer-Level AuSn Soldering
    • R.S. Forman and G. Minogue, "The Basics of Wafer-Level AuSn Soldering," Chip Scale Review, Vol. 8, pp. 55-59, 2004.
    • (2004) Chip Scale Review , vol.8 , pp. 55-59
    • Forman, R.S.1    Minogue, G.2
  • 2
    • 0026821838 scopus 로고
    • A low temperature bonding process using deposited gold tin composites
    • C.C. Lee and C.Y. Wang, "A low temperature bonding process using deposited gold tin composites", Thin Solid Films, 208, pp 202-209, 1992.
    • (1992) Thin Solid Films , vol.208 , pp. 202-209
    • Lee, C.C.1    Wang, C.Y.2
  • 3
    • 38749093333 scopus 로고    scopus 로고
    • Interfacial metallurgical reaction between small flip-chip Sn/Au bumps and thin film Au/TiW metallizatgion under multiple reflow
    • D.Q. Yu, H. Oppermann, J. Kleff and M. Hutter, "Interfacial metallurgical reaction between small flip-chip Sn/Au bumps and thin film Au/TiW metallizatgion under multiple reflow", Scripta Materials, 58, pp 606-609, 2008.
    • (2008) Scripta Materials , vol.58 , pp. 606-609
    • Yu, D.Q.1    Oppermann, H.2    Kleff, J.3    Hutter, M.4
  • 4
    • 0009553150 scopus 로고    scopus 로고
    • Gold and gold-tin wafer bumping by electrricchemical deposition for flip chip and TAB
    • Nürnberg, pp
    • L. Dietrich, G. Engelmann, O. Ehrmann and H. Reichl, "Gold and gold-tin wafer bumping by electrricchemical deposition for flip chip and TAB", EuPac'98, Nürnberg, pp 28-31, 1998.
    • (1998) EuPac'98 , pp. 28-31
    • Dietrich, L.1    Engelmann, G.2    Ehrmann, O.3    Reichl, H.4
  • 5
    • 34147096895 scopus 로고    scopus 로고
    • Fluxless silicon to alumina bonding using electroplated Au-Sn-Au structure at eutectic composition
    • J.S. Kim, W.S. Choi, D. Kim, A. Shkel, C.C. Lee, "Fluxless silicon to alumina bonding using electroplated Au-Sn-Au structure at eutectic composition," Materials Science & Engineering A, Vol. 458, pp. 101-107, 2007.
    • (2007) Materials Science & Engineering A , vol.458 , pp. 101-107
    • Kim, J.S.1    Choi, W.S.2    Kim, D.3    Shkel, A.4    Lee, C.C.5
  • 8
    • 34147143396 scopus 로고    scopus 로고
    • Fluxless bonding of silicon to Ag-cladded copper using Sn-based alloys
    • J.S. Kim, T. Yokozuka, and C. C. Lee, "Fluxless bonding of silicon to Ag-cladded copper using Sn-based alloys", Materials Science & Engineering A, vol. 458, pp. 116-122, 2007.
    • (2007) Materials Science & Engineering A , vol.458 , pp. 116-122
    • Kim, J.S.1    Yokozuka, T.2    Lee, C.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.