Annealing of nanocrystalline silicon micro-bridges with electrical stress

Materials Research Society Symposium Proceedings

Volumn 1144, Issue , 2009, Pages 25-29

  Bakan, Gokhan ^a   Cywar, Adam ^a   Boztug, Cicek ^a   Akbulut, Mustafa B ^a   Silva, Helena ^a   Gokirmak, Ali ^a  

^a University of Connecticut   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT PADS; ELECTRICAL STRESS; MOLTEN SILICON; PULSE AMPLITUDE; SHORT DURATIONS; SURFACE TEXTURES; THROUGH CURRENT; VOLTAGE PULSE;

ELECTRIC WIRE; NANOWIRES;

NANOCRYSTALLINE SILICON;

EID: 70449794488     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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