Focused ion beam processing and engineering of devices in self-assembled supramolecular structures

Nanotechnology

Volumn 20, Issue 48, 2009, Pages

  Huyang, George ^a   Canning, John ^a   Gibson, Brant C ^b   Khoury, Tony ^a   Sum, Tze Jing ^a   Neto, Chiara ^a   Crossley, Maxwell J ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

^b UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BIOSENSING; COMPLEX DEVICES; CUTTING CONDITIONS; INTEGRATED OPTICAL WAVEGUIDES; MILLING RATE; NEW OPPORTUNITIES; OPTICAL FIBRE; OPTICAL FLATNESS; ORGANIC SYSTEMS; PHOTONIC APPLICATION; PHOTONIC WAVEGUIDES; PHOTOVOLTAICS; RAPID PROCESSING; ROOT MEAN SQUARED; SELF ASSEMBLED STRUCTURES; SELF-ASSEMBLED; SILICON PLATFORMS; SUPRAMOLECULAR STRUCTURE;

ATOMIC FORCE MICROSCOPY; CUTTING; FOCUSED ION BEAMS; INTEGRATED OPTOELECTRONICS; OPTICAL DEVICES; OPTICAL FIBERS; OPTICAL INSTRUMENTS; PHOTORESISTS; PORPHYRINS; SILICA; SUPRAMOLECULAR CHEMISTRY; SURFACE PROPERTIES; SURFACE ROUGHNESS; TELECOMMUNICATION EQUIPMENT; TWO DIMENSIONAL; WAVEGUIDES;

CRYSTAL ATOMIC STRUCTURE;

GLASS FIBER; PORPHYRIN; SILICON; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; CONTROLLED STUDY; FOCUSED ION BEAM; GENETIC PROCEDURES; PRIORITY JOURNAL; RADIATION PROCESSING; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TELECOMMUNICATION; CHEMISTRY; INSTRUMENTATION; NANOTECHNOLOGY;

MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; NANOTECHNOLOGY; PORPHYRINS;

EID: 70449753415     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/48/485301     Document Type: Article

References (22)

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