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Volumn 197, Issue 3, 2010, Pages 159-164
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Triple phase structure and electron density analysis of the thermoelectric material Bi80Sb20
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Author keywords
BiSb; Electron density; MEM; Rietveld; Thermoelectric
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Indexed keywords
BI-SB ALLOYS;
BISB;
D ELECTRONS;
ELECTRON DENSITIES;
ELECTRON DENSITY ANALYSIS;
ELECTRON DENSITY DISTRIBUTION;
GROWTH METHOD;
HIGH TEMPERATURE MELTS;
LOCAL STRUCTURE;
LOCALIZED ELECTRONS;
MAXIMUM ENTROPY METHODS;
POWDER XRD;
RIETVELD;
THERMOELECTRIC MATERIAL;
THREE PHASIS;
CARRIER CONCENTRATION;
ELECTRON DENSITY MEASUREMENT;
ELECTRONIC DENSITY OF STATES;
RIETVELD METHOD;
RIETVELD REFINEMENT;
THERMOELECTRIC EQUIPMENT;
ELECTRONS;
ANTIMONY;
BISMUTH;
ARTICLE;
CHEMICAL BOND;
CHEMICAL STRUCTURE;
CONTROLLED STUDY;
DENSITY;
ELECTRICITY;
ELECTRON;
ENTROPY;
HIGH TEMPERATURE;
STOICHIOMETRY;
X RAY DIFFRACTION;
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EID: 70449670319
PISSN: 00325910
EISSN: None
Source Type: Journal
DOI: 10.1016/j.powtec.2009.09.009 Document Type: Article |
Times cited : (11)
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References (14)
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