High resolution electron density mapping for LiF and NaF by maximum entropy method (MEM)

Journal of Physics and Chemistry of Solids

Volumn 64, Issue 1, 2003, Pages 43-49

  Israel, S ^a   Saravanan, R ^b   Srinivasan, N ^c   Rajaram, R K ^b  

^a THE AMERICAN COLLEGE   (India)

^b MADURAI KAMARAJ UNIVERSITY   (India)

^c THIAGARAJAR COLLEGE   (India)

Author keywords

A. Inorganic compounds; C. X ray diffraction; D. Electrical properties

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC PROPERTIES; ENTROPY; HIGH RESOLUTION ELECTRON MICROSCOPY; SODIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

MAXIMUM ENTROPY METHOD (MEM);

LITHIUM COMPOUNDS;

EID: 0037213806     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(02)00208-1     Document Type: Article

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