A novel approach for monodisperse samarium orthovanadate nanocrystals: Controlled synthesis and characterization

Journal of Physical Chemistry C

Volumn 113, Issue 43, 2009, Pages 18584-18595

  Nguyen, Thanh Dinh ^a,b   Dinh, Cao Thang ^a,b   Nguyen, Dinh Tuyen ^a,b   Do, Trong On ^a,b  

^a UNIVERSITÉ LAVAL   (Canada)

^b GRADUATE UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Viet Nam)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION/DESORPTION; AVERAGE PARTICLE SIZE; CONCENTRATION OF; CONTROLLED SYNTHESIS; FTIR; HEXAGONAL SHAPES; MILD REACTION; MONODISPERSE; NANO-CORES; NANOCRYSTAL SURFACE; OLEYLAMINE; ORTHO-VANADATE; OXIDATION STATE; REACTION PARAMETERS; REACTION SOLUTIONS; SAMARIUM OXIDES; SELECTED AREA ELECTRONIC DIFFRACTION; SHAPE EVOLUTION; SINGLE-CRYSTALLINE; SOLVOTHERMAL APPROACH; SOLVOTHERMAL PATHWAY; SYNTHESIS CONDITIONS; SYNTHESIS SOLUTION; SYNTHETIC APPROACH; THERMOGRAVIMETRIC-DIFFERENTIAL THERMAL ANALYSIS; UV-VISIBLE; VANADIUM OXIDES; X RAY PHOTOELECTRON SPECTRA; XPS; XRD PATTERNS;

ACIDS; ASPECT RATIO; ATMOSPHERIC TEMPERATURE; DIFFRACTION; DYES; ELECTRIC WIRE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; METAL COMPLEXES; NANOCRYSTALS; NEGATIVE IONS; OLEIC ACID; OXIDATION; SAMARIUM; SURFACE ACTIVE AGENTS; SYNTHESIS (CHEMICAL); THERMOANALYSIS; TOLUENE; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS; VANADIUM COMPOUNDS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

COMPLEXATION;

EID: 70449565159     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp907129t     Document Type: Article

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