Room temperature electrosynthesis of ZnSe thin films

Journal of Alloys and Compounds

Volumn 488, Issue 1, 2009, Pages 157-162

  Gudage, Y G ^a   Deshpande, N G ^a   Sagade, Abhay A ^a   Sharma, Ramphal ^a  

^a DR BABASAHEB AMBEDKAR MARATHWADA UNIVERSITY   (India)

Author keywords

Atomic force microscopy; Cubic phase; Electrosynthesis; X ray diffraction; ZnSe

Indexed keywords

AFM; COATED GLASS SUBSTRATES; CUBIC PHASE; CUBIC STRUCTURE; ELECTROCHEMICAL BEHAVIOUR; ELECTROSYNTHESIS; ENERGY DISPERSIVE ANALYSIS; FLUORINE DOPED TIN OXIDE; MICROSTRUCTURAL PROPERTIES; OPTICAL ABSORPTION; POROUS LAYERS; PREFERENTIAL ORIENTATION; ROOM TEMPERATURE; SEM; SEM MICROGRAPHS; STAINLESS STEEL SUBSTRATES; VOLTAMMETRIC CURVES; ZINC SELENIDE; ZNSE; ZNSE THIN FILMS;

ATOMIC FORCE MICROSCOPY; ATOMS; DIFFRACTION; FLUORINE; GLASS; METAL ANALYSIS; ORGANIC POLYMERS; OXIDE FILMS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; STAINLESS STEEL; STRUCTURAL ANALYSIS; SUBSTRATES; THIN FILMS; TIN; X RAY DIFFRACTION; ZINC;

X RAY DIFFRACTION ANALYSIS;

EID: 70449530854     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.11.036     Document Type: Article

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