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Volumn 30, Issue 2, 2010, Pages 481-484

Characterization of the biaxial textures of MgO thin films grown by E-beam evaporation

Author keywords

Films; Functional applications; MgO; Non destructive evaluation; X ray methods

Indexed keywords

AMORPHOUS GLASS; BIAXIAL TEXTURES; DEPOSITION PARAMETERS; E BEAM EVAPORATION; ELECTRON BEAM EVAPORATION; FUNCTIONAL APPLICATIONS; GLASS SUBSTRATES; MGO; MGO FILMS; MGO THIN FILMS; NON-DESTRUCTIVE EVALUATION; NOVEL METHODS; SCATTERING INTENSITY; SEM; SODA LIME GLASS SUBSTRATE; SURFACE NORMALS; THIN FILM SURFACES; VAPOR FLUXES; VAPOR SOURCES; X RAY POLE FIGURES; X-RAY METHODS; XRD;

EID: 70449526815     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2009.06.015     Document Type: Article
Times cited : (13)

References (12)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.