메뉴 건너뛰기




Volumn 177-178, Issue , 2004, Pages 784-788

Influence of O2 flow rate on the structural properties of MgO films deposited by dual magnetron sputtering

Author keywords

Dual magnetron sputtering; MgO films; O2 flow rate; Secondary electron emission coefficient

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; CRYSTAL ORIENTATION; MAGNETRON SPUTTERING; METALLIC FILMS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SURFACE DISCHARGES; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

EID: 1342310553     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2003.06.007     Document Type: Article
Times cited : (21)

References (22)
  • 15
    • 1342300024 scopus 로고    scopus 로고
    • SIMNRA version 5.0 Software
    • W.L. Morgan, J.-P. Boeuf, L.C. Pitchford
    • M. Mayer, 'SIMNRA version 5.0 Software', W.L. Morgan, J.-P. Boeuf, L.C. Pitchford, 'The Siglo Data base, CPAT and kinema Software', http://www.siglo-kinema.com/database/
    • The Siglo Data Base, CPAT and Kinema Software
    • Mayer, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.