Structural and optical properties of MgyNi1-yHx gradient thin films in relation to the as-deposited metallic state

International Journal of Hydrogen Energy

Volumn 34, Issue 21, 2009, Pages 8951-8957

  Gremaud, R ^a,b   van Mechelen, J L M ^a,c   Schreuders, H ^a   Slaman, M ^a   Dam, B ^a,d   Griessen, R ^a  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^c UNIVERSITY OF GENEVA   (Switzerland)

^d DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Combinatorial; Hydrogen storage; Hydrogenography; Magnesium nickel hydride; Mg2NiH4; MgH2; Thin film

Indexed keywords

BEFORE AND AFTER; CHEMICAL COMPOSITIONS; COMPOSITIONAL DEPENDENCE; DC RESISTIVITY; EUTECTIC POINTS; HIGH-THROUGHPUT; HYDROGEN STORAGE MATERIALS; HYDROGENOGRAPHY; LONG RANGE ORDERS; METALLIC STATE; MG2NIH4; MICROSTRUCTURAL CHANGES; NEW TOOLS; NICKEL HYDRIDES; OPTICAL SPECTROPHOTOMETRY; PARENT PHASE; STRUCTURAL AND OPTICAL PROPERTIES; X-RAY DIFFRACTION MEASUREMENTS;

HYDROGEN; MAGNESIUM; NICKEL; NICKEL ALLOYS; OPTICAL PROPERTIES; SPECTROPHOTOMETRY; THIN FILM DEVICES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

HYDROGEN STORAGE;

EID: 70449492990     PISSN: 03603199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijhydene.2009.08.051     Document Type: Article

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