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Volumn 309, Issue 5735, 2005, Pages 752-755
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Chemistry: Electron localization determines defect formation on ceria substrates
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Author keywords
[No Author keywords available]
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Indexed keywords
CERIA;
ELECTRON LOCALIZATION;
HIGH RESOLUTION SCANNING TUNNELING MICROSCOPY;
OXIDATION PROCESSES;
CATALYSIS;
ELECTRON ENERGY LEVELS;
INTERFACES (MATERIALS);
OXIDATION;
RARE EARTH ADDITIONS;
SCANNING TUNNELING MICROSCOPY;
CERIUM COMPOUNDS;
BUFFER;
CERIUM;
LANTHANIDE;
OXIDE;
OXYGEN;
MICROSCOPY;
OXYGEN;
ARTICLE;
DENSITY FUNCTIONAL THEORY;
ELECTRON;
ENZYME SUBSTRATE;
OXIDATION;
PRIORITY JOURNAL;
REACTION ANALYSIS;
REDUCTION;
SCANNING TUNNELING MICROSCOPY;
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EID: 23044467012
PISSN: 00368075
EISSN: None
Source Type: Journal
DOI: 10.1126/science.1111568 Document Type: Article |
Times cited : (1250)
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References (29)
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