Denoising and feature extraction for control chart pattern recognition in autocorrelated processes

International Journal of Signal and Imaging Systems Engineering

Volumn 1, Issue 2, 2008, Pages 115-126

  Cheng, Hui Ping ^a   Cheng, Chuen Sheng ^b  

^a MINGDAO UNIVERSITY   (Taiwan)

^b YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

autocorrelated processes; discrete wavelet transform; DWT; multi resolution analysis; neural network; pattern recognition; SPC; statistical process control

Indexed keywords

EID: 70449335353     PISSN: 17480698     EISSN: 17480701     Source Type: Journal    
DOI: 10.1504/IJSISE.2008.020918     Document Type: Article

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