Multiscale SPC using wavelets: Theoretical analysis and properties

AIChE Journal

Volumn 49, Issue 4, 2003, Pages 939-958

  Aradhye, Hrishikesh B ^a,b   Bakshi, Bhavik R ^a   Strauss, Ramon A ^a,c   Davis, James F ^a,d  

^a Ohio State University   (United States)

^b SRI INTERNATIONAL   (United States)

^c EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCIES; MEASUREMENTS; PERFORMANCE; RANDOM PROCESSES;

SHEWHART CHARTS;

WAVELET TRANSFORMS;

DATA;

ARTICLE; CHEMICAL ENGINEERING; PETROCHEMICAL INDUSTRY; PROCESS CONTROL; THEORETICAL STUDY; WAVEFORM;

EID: 0037392450     PISSN: 00011541     EISSN: None     Source Type: Journal    
DOI: 10.1002/aic.690490412     Document Type: Article

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