On sample selection bias and its efficient correction via model averaging and unlabeled examples

Proceedings of the 7th SIAM International Conference on Data Mining

Volumn , Issue , 2007, Pages 320-331

  Fan, Wei ^a   Davidson, Ian ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b State University of New York   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LEARNING ALGORITHMS; MACHINE LEARNING; PROBABILITY DISTRIBUTIONS; SUPERVISED LEARNING;

CONDITIONAL PROBABILITIES; DATA MINING ALGORITHM; INDUCTIVE MODELING; JOINT PROBABILITY; REAL WORLD SITUATIONS; SAMPLE SELECTION BIAS; SCHOOL ENROLLMENT; SEMI- SUPERVISED LEARNING;

DATA MINING;

EID: 70449134523     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1137/1.9781611972771.29     Document Type: Conference Paper

References (13)

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