Learning and evaluating classifiers under sample selection bias

Proceedings, Twenty-First International Conference on Machine Learning, ICML 2004

Volumn , Issue , 2004, Pages 903-910

  Zadrozny, Bianca ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLASSIFIERS LEARNING METHODS; ECONOMETRICS; SAMPLE SELECTION BIAS; TRAINING DATA;

CLASSIFICATION (OF INFORMATION); CORRELATION METHODS; EVALUATION; MATHEMATICAL MODELS; PROBABILITY; PROBLEM SOLVING; RANDOM PROCESSES; SAMPLING;

LEARNING SYSTEMS;

EID: 14344263218     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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