A bayesian network framework for reject inference

KDD-2004 - Proceedings of the Tenth ACM SIGKDD International Conference on Knowledge Discovery and Data Mining

Volumn , Issue , 2004, Pages 286-295

  Smith, Andrew ^a   Elkan, Charles ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Bayesian networks; Expectation maximization; Heckman estimator; Propensity scores; Reject inference; Sample selection bias

Indexed keywords

COMPUTATIONAL METHODS; DATA HANDLING; LEARNING ALGORITHMS; MATHEMATICAL MODELS; OPTIMIZATION; RANDOM PROCESSES;

BAYESIAN NETWORKS; EXPECTATION MAXIMIZATION; HECKMAN ESTIMATORS; PROPENSITY SCORES; REJECT INFERENCE; SAMPLE SELECTION BIAS;

LEARNING SYSTEMS;

EID: 12244265089     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1014052.1014085     Document Type: Conference Paper

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