Structural phase transitions in Au thin films on Si (1 1 0): An in situ temperature dependent transmission electron microscopy study

Applied Surface Science

Volumn 256, Issue 2, 2009, Pages 567-571

  Bhatta, Umananda M ^a   Dash, J K ^a   Rath, A ^a   Satyam, P V ^a  

^a INSTITUTE OF PHYSICS   (India)

Author keywords

Au on Si (1 1 0); In situ electron microscopy; Nanosilicides

Indexed keywords

ASPECT RATIO; GOLD; GOLD DEPOSITS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; NANORODS; SILICIDES; SILICON; THERMAL EVAPORATION; TRANSMISSION ELECTRON MICROSCOPY; ULTRAHIGH VACUUM; VACUUM EVAPORATION;

HIGH ASPECT RATIO; HIGH-VACUUM CONDITIONS; IN-SITU ELECTRON MICROSCOPY; IN-SITU TEMPERATURE; NANOSILICIDES; SELECTED AREA DIFFRACTION PATTERNS; SMALL ASPECT RATIO; STRUCTURAL PHASE TRANSITION;

THIN FILMS;

EID: 70449123632     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.08.054     Document Type: Article

References (29)

1. Hiraki A., Nicolet M.A., and Mayer J.W. Appl. Phys. Lett. 18 (1971) 178
2. Narusawa T., Komiya S., and Hiraki A. Appl. Phys. Lett. 22 (1973) 389
3. Hiraki A., Lugujjo E., and Mayer J.W. J. Appl. Phys. 43 (1972) 3643
4. Hiraki A., Shuto K., Kim S., Kammura W., and Iwami M. Appl. Phys. Lett. 31 (1977) 611
5. Iwami M., Kim S., Kammura W., and Hiraki A. Japan. J. Appl. Phys. 19 Suppl. 19-1 (1980) 489
6. Mayer J.W., and Tu K.N. J. Vac. Sci. Technol. 11 (1974) 86
7. Guy Le lay. Surf. Sci. 132 (1983) 169
8. Cros A., and Muret P. Mater. Sci. Rep. 8 (1992) 271
9. Sekar K., Kuiri G., Satyam P.V., Sundaravel B., Mohapatra D.P., and Dev B.N. Phys. Rev. B 51 (1995) 14330
10. Rout B., Sundaravel B., Das A.K., Ghose S.K., Sekar K., and Mahapatra D.P. J. Vac. Sci. Technol. B 18 (2000) 1847
11. Tersoff J., and Tromp R.M. Phys. Rev. Lett. 70 (1993) 2782
12. Bhatta U.M., Dash J.K., Roy A., Rath A., and Satyam P.V. J. Phys. Condens. Matter 21 (2009) 205403
13. Wagner R.S., and Ellis W.C. Appl. Phys. Lett. 4 (1964) 89
14. Wacaser B.A., Dick K.A., Johansson J., Borgstrom M.T., Deppert K., and Samuelson L. Adv. Mater. 21 (2009) 153 (references there in)
15. Kim B., Tersoff J., Kodambaka S., Reuter M.C., and Ross F.M. Science 322 (2008) 1070
16. Hannon J.B., Kodambaka S., Ross F.M., and Tromp R.M. Nature 440 (2006) 69
17. Kodambaka S., Hannon J.B., Tromp R.M., and Ross F.M. Nano Lett. 6 (2006) 1292
18. Hourlier-Bahloul D., and Perrot P. C. R. Chim. 10 (2007) 658
19. Fujita K., Watanabe H., and Ichikawa M. Surf. Sci. 398 (1998) 134
20. U.M. Bhatta, A. Rath, J.K. Dash, J. Ghatak, L. Yi-Feng, C.-P. Liu, P.V. Satyam, Nanotechnology, submitted for publication.
21. Moyen E., Macé M., Agnus G., Fleurence A., Maroutian T., Houzé F., Stupakiewicz A., Masson L., Bartenlian B., Wulfhekel W., Beauvillain P., and Hanbücken M. Appl. Phys. Lett. 94 (2009) 233101
22. Goswami D.K., Satpati B., Satyam P.V., and Dev B.N. Curr. Sci. 84 (2003) 903
23. Suryanarayana C., and Anantharaman T.R. Mater. Sci. Eng. 13 (1974) 73
24. Mayer J.W., Tsaur B.Y., Lau S.S., and Hung L.S. Nucl. Instrum. Methods 182/183 (1981) 97
25. Anantharaman T.R., Luo H.L., and Klement W. Nature (London) 210 (1966) 1040
26. Gaigher H.L., and Van der Berg N.G. Thin Solid Films 68 (1980) 373
27. Green A.K., and Bauer E. J. Appl. Phys. 47 (1976) 1284
28. Tsaur B.Y., and Mayer J.W. Philos. Mag. A 43 (1981) 345
29. Hultman L., Robertson A., Hentzell T.G., Enstroem I., and Psaras P.A. J. Appl. Phys. 62 (1987) 3647