A ZnO/PET assembly study: Optimization and investigation of the interface region

Materials Chemistry and Physics

Volumn 119, Issue 1-2, 2010, Pages 158-168

  Ben Amor, S ^a,b   Jacquet, M ^c   Fioux, P ^d   Nardin, M ^d  

^a Ecole Preparatoire aux Academies Militaires   (Tunisia)

^b ISSATS   (Tunisia)

^c UNIVERSITÉ CLERMONT AUVERGNE   (France)

^d INSTITUT DE CHIMIE DES SURFACES ET INTERFACES   (France)

Author keywords

Adhesion; Interface; PET; Zinc oxide

Indexed keywords

AFM OBSERVATION; ARGON PLASMAS; CARBON DIOXIDE PLASMA; CERAMIC TARGET; COATING PROPERTIES; COLD PLASMAS; CRYSTALLINITIES; FUNCTIONALISATION; INTERFACE; INTERFACE REGIONS; OPTIMIZED CONDITIONS; OXYGEN PARTIAL PRESSURE; PET; PET FILMS; PLASMA COMPOSITION; POLAR COMPONENTS; POLYMER SURFACES; R.F. MAGNETRON SPUTTERING; RUTHERFORD BACKSCATTERING SPECTROMETRY; SPUTTERING GAS; SPUTTERING PARAMETERS; STRUCTURAL STUDIES; SURFACE FREE ENERGY; TAKE-OFF ANGLE; THIN LAYERS; WETTABILITY MEASUREMENTS; XPS; ZINC OXIDE THIN FILMS;

ADHESION; ARGON; BOND STRENGTH (CHEMICAL); CARBON DIOXIDE; FUNCTIONAL POLYMERS; OXYGEN; PARTIAL PRESSURE; PHASE INTERFACES; PLASMAS; PLASTIC COATINGS; POLYETHYLENE TEREPHTHALATES; POLYMER FILMS; POLYMERS; POSITIVE IONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STOICHIOMETRY; THERMOPLASTICS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC; ZINC OXIDE;

OXIDE FILMS;

EID: 70449100771     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2009.08.042     Document Type: Article

References (33)

1. Norris B.J., Anderson J., Wager J.F., and Keszler D.A. J. Phys. D: Appl. Phys. 36 (2003) L105
2. Kee C.-S., Ko D.-K., and Lee J. J. Phys. D: Appl. Phys. 38 (2005) 3850
3. Wang K., Vygranenko Y., and Nathan A. J. Appl. Phys. 101 (2007) 114508
4. Albert K.J., Lewis N.S., Sahauer C.L., Sotzing G.A., Stizel S.E., Vaid T.P., and Walt D.R. Chem. Rev. 100 (2000) 2595
5. Fortunato E., Raniero L., Silva L., Gonçalves A., Pimentel A., Barquinha P., Águas H., Pereira L., Gonçalves G., Ferreira I., Elangovan E., and Martins R. Solar Energy Mater. Sol. Cells 92 (2008) 1605
6. Bachir S., Sandouly C., Kossanyi J., and Ranford-Haret J.C. J. Phys. Chem. Solids 57 (1996) 1869
7. Kang B.-A., Hwang K., and Jeong J. J. Sol-Gel Sci. Technol. 43 (2007) 145
8. Huang J., Ye Z., Lu H., Wang L., Zhao B., and Li X. J. Phys. D: Appl. Phys. 40 (2007) 4882
9. Lupan O., Shishiyanu S., Chow L., and Shishiyanu T. Thin Solid Films 516 10 (2008) 3338
10. Rakshani A.E., Kokaj J., Mathew J., and Peradeep B. Appl. Phys. A: Mater. Sci. Process. 86 (2007) 377
11. Furuta M., Hiramatsu T., Matsuda T., Li C., Furuta H., and Hirao T. J. Non-Cryst. Solids 354 (2008) 1926
12. Singh S., Ganguli T., Kumar R., Srinivasa R.S., and Major S.S. Thin Solid Films 517 (2008) 661
13. Chu W.K., Mayer J.W., and Nicolet M.A. Backscattering Spectrometry (1978), Academic Press, New York
14. Hoffman R.W. Physics of Non-metallic Thin Films vol. B-14 (1970), Pllenum, New York
15. Schultz J., Tsutsumi K., and Donnet J.B. J. Colloid Interface Sci. 59 (1977) 272
16. Cullity B.D. Elements of X-ray Diffraction. 2nd Ed. (1978), Addison Wesley, Reading, MA
17. Bachari E.M., Ben Amor S., Baud G., and Jacquet M. Mater. Sci. Eng. B79 (2001) 165-174
18. Winters H.F., and Sigmund P. J. Appl. Phys. 45 (1974) 4760
19. Krug J. Phys. Rev. Lett. 75 (1995) 1795
20. Iacob E., Bersani M., Lui A., Giubertoni D., Barozzi M., and Anderle M. Appl. Surf. Sci. 238 (2004) 24
21. Tong W.M., and Williams R.S. Ann. Rev. Phys. Chem. 45 (1994) 401
22. Atreya M., Li S., Kang E.T., Neoh K.G., Ma Z.H., and Tan K.L. J. Vac. Sci. Technol. A17 (1999) 853
23. Ling Q.D., Li S., Kang E.T., Neoh K.G., Liu B., and Wei Huang. Appl. Surf. Sci. 199 (2002) 74
24. Sun H., Bai Y., Cheng Y., Jin W., and Xu N. Ind. Eng. Chem. Res. 45 (2006) 4971
25. Zhou X.F., Hu Z.L., Chen Y., and Shang H.Y. Mater. Res. Bull. 43 (2008) 2790
26. Zaleska A., Gorska P., Sobczak J.W., and Hupka J. Appl. Catal. B: Environ. 76 (2007) 1
27. Futsuhara M., Yoshioka K., and Takai O. Thin Solid Films 322 (1998) 274
28. Mutel B., Ben Taleb A., Dessaux O., Goudmand P., Gengembre L., and Grimblot J. Thin Solid Films 266 (1995) 119
29. Moulder J.F., Stickle Q.W.F., Sobol P.E., and Bomben K.D. In: Chastain J., and King Jr. R.C. (Eds). Handbook of X-ray Photoelectron Spectroscopy (1995), Physical Electronics Inc., Eden Praririe
30. Parhi P., and Manivannan V. J. Alloys Compd. 469 (2009) 558
31. Vincent Crist B. Handbook of Monochromatic XPS spectra, Semi-conductors (2000), John Wiley and Sons Ed
32. Wagner C.D. Farad. Disc. Chem. Soc. 60 (1975) 291
33. Evans S. Surf. Interface Anal. 7 (1985) 299