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Review of Scientific Instruments

Volumn 80, Issue 10, 2009, Pages

Deterministic fabrication of carbon nanotube probes using the dielectrophoretic assembly and electrical detection

(6) Lim, Donghyun a Kwon, Soongeun a Lee, Jonghyun a Shim, Hyung Cheoul a Lee, Hyung Woo b Kim, Soohyun a

a Korea Advanced Institute of Science and Technology (KAIST) (South Korea)

b USA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AC ELECTRIC FIELD; CARBON NANOTUBE PROBES; CURRENT DATA; CURRENT DETECTION; DC ELECTRIC FIELD; DIELECTROPHORETIC ASSEMBLY; DIELECTROPHORETIC MANIPULATION; DIRECT CURRENT; ELECTRICAL DETECTION; IN-FIELD; LINEAR RELATIONSHIPS; REAL TIME; SEM IMAGE; TUNGSTEN TIP;

CARBON NANOTUBES; DIELECTRIC DEVICES; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELDS; FABRICATION; FIELD EMISSION; FIELD EMISSION MICROSCOPES; SCANNING ELECTRON MICROSCOPY; TUNGSTEN;

PROBES;

EID: 70350746487 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3223348 Document Type: Article

Times cited : (4)

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