SCOPUS 정보 검색 플랫폼

Measurement Science and Technology

Volumn 20, Issue 8, 2009, Pages

Nonlinear distortion in atomic force microscopy (AFM) measurements

(3) Hahlweg, C a Gruhlke, M a Rothe, H a

a HELMUT SCHMIDT UNIVERSITY (Germany)

Author keywords

AFM; Distortion; Spectral effects; Tip geometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONVOLUTION; DISTORTION (WAVES); MATHEMATICAL MORPHOLOGY; SURFACE RECONSTRUCTION;

CLOSED-LOOP CONTROL; MORPHOLOGICAL IMAGE PROCESSING; MORPHOLOGICAL OPERATIONS; NONLINEAR NATURE; SPECTRAL EFFECTS; SURFACE FROM; SURFACE FUNCTIONS; TIP GEOMETRY;

IMAGE PROCESSING;

EID: 70350643585 PISSN: 09570233 EISSN: 13616501 Source Type: Journal
DOI: 10.1088/0957-0233/20/8/084018 Document Type: Article

Times cited : (10)

References (12)

1
- 46749099831
- Neural network approximation of tip-abrasion effects in AFM imaging
- Bakucz P, Yacoot A, Dziomba T, Koenders L and Krüger-Sehm R 2008 Neural network approximation of tip-abrasion effects in AFM imaging Meas. Sci. Technol. 19 065101
- (2008) Meas. Sci. Technol. , vol.19 , Issue.6 , pp. 065101
- Bakucz, P.¹ Yacoot, A.² Dziomba, T.³ Koenders, L.⁴ Krüger-Sehm, R.⁵

2
- 70350626217
- Unified analysis of tracing and tracking error
- Cooper D H 1963 Unified analysis of tracing and tracking error IEEE Trans. Audio 11 141-8
- (1963) IEEE Trans. Audio , vol.11 , Issue.4 , pp. 141-148
- Cooper, D.H.¹

3
- 0002408798
- Dimensional metrology with scanning probe microscopes
- Griffith J E and Grigg D A 1993 Dimensional metrology with scanning probe microscopes J. Appl. Phys. 74 R83-109
- (1993) J. Appl. Phys. , vol.74 , Issue.9 , pp. 83-109
- Griffith, J.E.¹ Grigg, D.A.²

4
- 0026206391
- Reconstruction of STM and AFM images distorted by finite-size tips
- Keller D 1991 Reconstruction of STM and AFM images distorted by finite-size tips Surf. Sci. 253 353-64
- (1991) Surf. Sci. , vol.253 , Issue.1-3 , pp. 353-364
- Keller, D.¹

5
- 70350699589
- Ber die nichtlineare Verzerrung bei der Wiedergabe von Schallplatten infolge Winkelabweichungen des Abtastorgans
- Löfgren E 1938 ber die nichtlineare Verzerrung bei der Wiedergabe von Schallplatten infolge Winkelabweichungen des Abtastorgans Akustische Z. 11 350-62
- (1938) Akustische Z. , vol.11 , pp. 350-362
- Löfgren, E.¹

6
- 53949089683
- On distortion in sound reproduction from phonograph records
- Pierce J A and Hunt F V 1938 On distortion in sound reproduction from phonograph records J. Acoust. Soc. Am. 10 14-28
- (1938) J. Acoust. Soc. Am. , vol.10 , Issue.1 , pp. 14-28
- Pierce, J.A.¹ Hunt, F.V.²

7
- 33947406131
- Eliminating bistability and reducing sample damage through frequency and amplitude modulation in tapping-mode atomic force microscopy
- Solares S D 2007 Eliminating bistability and reducing sample damage through frequency and amplitude modulation in tapping-mode atomic force microscopy Meas. Sci. Technol. 18 592-600
- (2007) Meas. Sci. Technol. , vol.18 , Issue.3 , pp. 592-600
- Solares, S.D.¹

8
- 33947434214
- Frequency and force modulation atomic force microscopy: Low-impact tapping-mode imaging without bistability
- Solares S D 2007 Frequency and force modulation atomic force microscopy: low-impact tapping-mode imaging without bistability Meas. Sci. Technol. 18 L9-14
- (2007) Meas. Sci. Technol. , vol.18 , Issue.7 , pp. 9-14
- Solares, S.D.¹

9
- 84986703649
- Limits of topographic measurement by the scanning tunnelling and atomic force microscopes
- Stedman M 1988 Limits of topographic measurement by the scanning tunnelling and atomic force microscopes J. Microsc. 152 611-8
- (1988) J. Microsc. , vol.152 , pp. 611-618
- Stedman, M.¹

10
- 0028698741
- Morphological estimation of tip geometry for scanned probe microscopy
- Villarrubia J S 1994 Morphological estimation of tip geometry for scanned probe microscopy Surf. Sci. 321 287-300
- (1994) Surf. Sci. , vol.321 , Issue.3 , pp. 287-300
- Villarrubia, J.S.¹

11
- 42149101125
- Woschni E-G 1961 Frequenzmodulation. Theorie und Technik (Berlin: VEB Verlag Technik)
- (1961) Frequenzmodulation. Theorie und Technik
- Woschni, E.-G.¹

12
- 34247223253
- An atomic force microscope for the study of the effects of tip-sample interactions on dimensional metrology
- Yacoot A, Koenders L and Wolff H 2007 An atomic force microscope for the study of the effects of tip-sample interactions on dimensional metrology Meas. Sci. Technol. 18 350-9
- (2007) Meas. Sci. Technol. , vol.18 , Issue.2 , pp. 350-359
- Yacoot, A.¹ Koenders, L.² Wolff, H.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.