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Advanced Materials Research

Volumn 67, Issue , 2009, Pages 33-38

Determination of image forces in nanocrystals using finite element method

(3) Khanikar, Prasenjit a Kumar, Arun a Subramaniam, Anandh a

a INDIAN INSTITUTE OF TECHNOLOGY KANPUR (India)

Author keywords

Dislocation stress fields; Finite element method; Image force; Nanocrystals

Indexed keywords

CURRENT MODELS; DISLOCATION STRESS FIELDS; EDGE DISLOCATION; ENERGY FIELDS; FIRST-PRINCIPLES; FREE SURFACES; GLIDE COMPONENTS; HALF-PLANES; IMAGE FORCE; NUMERICAL MODELS; SIMULATION METHODOLOGY; STRESS FIELD; STRESS-FREE STRAINS; THEORETICAL EQUATION; THERMAL STRAIN;

GRAPH THEORY; NANOCRYSTALS; NUMERICAL METHODS; SIMULATORS; STRAIN; STRESSES;

FINITE ELEMENT METHOD;

EID: 70350506265 PISSN: 10226680 EISSN: None Source Type: Book Series
DOI: 10.4028/www.scientific.net/AMR.67.33 Document Type: Conference Paper

Times cited : (5)

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