Critical thickness of equilibrium epitaxial thin films using finite element method

Journal of Applied Physics

Volumn 95, Issue 12, 2004, Pages 8472-8474

  Subramaniam, Anandh ^a  

^a C 714 Riverdale Apartments ^*  (India)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; FINITE ELEMENT METHOD; METALLIC FILMS; NUCLEATION; SINGLE CRYSTALS; STRAIN; VECTORS;

CRITICAL THICKNESS; EQUILIBRIUM EPITAXIAL THIN FILMS; GLOBAL MINIMIZATION;

THIN FILMS;

EID: 3142605620     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1745115     Document Type: Review

References (18)

1. F. C. Frank and J. Van der Merve, Proc. R. Soc. London, Ser. A 198, 216 (1949).
2. S. C. Jain, A. H. Harker, and R. A. Cowley, Philos. Mag. A 75, 1461 (1997).
3. J. P. Hirth and J. Lothe, Theory of Dislocations (McGraw-Hill, New York, 1968).
4. W. Bollmann, Crystal Defects and Crystalline Interfaces (Springer, Berlin, 1970).
5. J. W. Matthews, Misfit Dislocations in Dislocations in Solids, edited by F. R. N. Nabarro (North-Holland, Amsterdam, 1979).
6. J. Woltersdorf, Appl. Surf. Sci. 11/12, 495 (1982).
7. S. C. Jain, J. R. Willis, and R. Bullough, Adv. Phys. 39, 127 (1990).
8. R. People and J. C. Bean, Appl. Phys. Lett. 47, 322 (1985).
9. T. Benabbas, Y. Androussi, and A. Lefebvre, J. Appl. Phys. 86, 1945 (1999).
10. U. Stigh, Mech. Mater. 14, 179 (1993).
11. Smithell's Metals Reference Book, edited by E. A. Brandes (Butterworths, London, 1983).
12. N. Ramakrishnan, VIDHAN user manual, Defense Metallurgical Research Laboratory report (1996).
13. T. Mura, Micromechanics of Defects in Solids (Nijhoff, Dordrecht, 1987).
14. J. W. Cahn, Acta Metall. 10, 179 (1962).
15. A. I. Fedorenko and R. Vincent, Philos. Mag. 27, 55 (1971).
16. J. W. Matthews and W. A. Jesser, Acta Metall. 15, 595 (1967).
17. W. A. Jesser and J. W. Matthews, Philos. Mag. 17, 461 (1968).
18. J. W. Matthews and A. E. Blakeslee, J. Cryst. Growth 27, 118 (1974).