Optical signature of structural defects in single walled and muitiwalled carbon nanotubes

Journal of Nanoscience and Nanotechnology

Volumn 9, Issue 9, 2009, Pages 5396-5401

  Singh, Dilip K ^a   Iyer, P K ^a   Giri, P K ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI   (India)

Author keywords

Carbon nanotubes; Defects; HRTEM; Photoluminescence; Raman

Indexed keywords

AS-GROWN; ELECTRON SPIN RESONANCE; FREQUENCY RANGES; HRTEM; HRTEM ANALYSIS; IMPURITY CONTENT; INTERMEDIATE FREQUENCIES; MULTI-WALLED; NANOTUBE WALLS; OPTICAL SIGNATURES; RADIAL BREATHING MODE; RAMAN; RAMAN MODES; RAMAN SPECTRA; ROOM TEMPERATURE; SINGLE-WALLED; SPECTROSCOPIC PROPERTY; STRUCTURAL DEFECT;

CARBON NANOTUBES; DEFECTS; ELECTRON SPIN RESONANCE SPECTROSCOPY; ELECTROSLAG REMELTING; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PHOTOLUMINESCENCE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTOR QUANTUM WELLS; SINGLE-WALLED CARBON NANOTUBES (SWCN); SPIN DYNAMICS; STRUCTURAL ANALYSIS;

MULTIWALLED CARBON NANOTUBES (MWCN);

EID: 70350325543     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2009.1139     Document Type: Conference Paper

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