Dielectric properties and energy storage capability of antiferroelectric Pbo.92La0.08Zro.95Ti0.05O 3 film-on-foil capacitors

Journal of Materials Research

Volumn 24, Issue 9, 2009, Pages 2993-2996

  Ma, Beihai ^a   Kwon, Do Kyun ^a,b   Narayanan, Manoj ^a   Balachandran, U ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b Hankuk Aviation University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROELECTRICS; APPLIED FIELD; CHEMICAL SOLUTION DEPOSITION; DC BIAS; ENERGY DENSITY; HIGHLY ACCELERATED LIFE TESTS; LANTHANUM NICKEL OXIDES; MEAN TIME TO FAILURE; PLZT FILMS; RELATIVE PERMITTIVITY; REVERSE PHASE; ROOM TEMPERATURE;

ANTIFERROELECTRICITY; CAPACITANCE; CAPACITORS; CERAMIC CAPACITORS; DIELECTRIC LOSSES; ELECTRIC FIELDS; HYSTERESIS; LEAD; NICKEL ALLOYS; NICKEL OXIDE; OXIDE FILMS; TESTING; ZIRCONIUM;

PHASE TRANSITIONS;

EID: 70350139725     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0349     Document Type: Article

References (13)

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