Multi Tbit/in2 storage densities with thermomechanical probes

Nano Letters

Volumn 9, Issue 9, 2009, Pages 3171-3176

  Wiesmann, D ^a   Rawlings, C ^a   Vecchione, R ^b   Porro, F ^b   Gotsmann, B ^a   Knoll, A ^a   Pires, D ^a   Duerig, U ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

^b STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COOPERATIVE EFFECTS; COOPERATIVELY REARRANGED REGIONS; COOPERATIVITY; CORRELATION LENGTHS; DATA DENSITY; DATA REPOSITORIES; DATA STORAGE TECHNOLOGY; FEATURE RESOLUTION; HIGH STORAGE DENSITY; INDENTATION RADIUS; NONLINEAR INTERACTIONS; REAL-SPACE; SCALING RELATIONS; SCANNING PROBES; SHAPE AND SIZE; SHARP INDENTER; SPATIAL RESOLUTION; STORAGE DENSITIES; THERMO-MECHANICAL;

POLYMER FILMS; POLYMERS; PROBES; SPACE PROBES;

VICKERS HARDNESS TESTING;

POLYMER; TERBIUM;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; ELECTRODE; MATERIALS TESTING; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY; TEMPERATURE;

ELECTRODES; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; NANOTECHNOLOGY; PARTICLE SIZE; POLYMERS; SURFACE PROPERTIES; TEMPERATURE; TERBIUM;

EID: 70350037675     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl9013666     Document Type: Article

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