Influence of ITO patterning on reliability of organic light emitting devices

Thin Solid Films

Volumn 518, Issue 2, 2009, Pages 497-500

  Wang, Zhaokui ^a   Naka, Shigeki ^a   Okada, Hiroyuki ^a  

^a UNIVERSITY OF TOYAMA   (Japan)

Author keywords

Indium tin oxide (ITO); Organic light emitting device (OLED); Patterning; Surface roughness

Indexed keywords

ETCHING PROCESS; ETCHING TIME; INDIUM TIN OXIDE (ITO); INDIUM TIN OXIDE FILMS; OPERATING CHARACTERISTICS; ORGANIC LIGHT EMITTING DEVICE (OLED); ORGANIC LIGHT-EMITTING DEVICES; PATTERNING; TRANSPARENT ELECTRODE;

ETCHING; HELMET MOUNTED DISPLAYS; INDIUM; LIGHT EMISSION; METAL ANALYSIS; ORGANIC LIGHT EMITTING DIODES (OLED); OXIDE FILMS; PHOTOLITHOGRAPHY; SURFACE PROPERTIES; SURFACE ROUGHNESS; TIN;

SUBSTRATES;

EID: 70349974979     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.07.029     Document Type: Article

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