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Volumn , Issue , 2009, Pages 283-287

Grain growth of electroplated copper film by alternative annealing methods

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING METHODS; CURRENT STRESS; ELECTROPLATED COPPER; ELECTROPLATED COPPER FILM; ELECTROPLATED CU FILMS; GRAIN SIZE; JOULE HEATING EFFECT; ROOM TEMPERATURE;

EID: 70349969400     PISSN: 15401766     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (8)
  • 1
    • 70349960538 scopus 로고    scopus 로고
    • Semiconductor Industries Association, 2007 ed, available from
    • ITRS Roadmap, Interconnect, Semiconductor Industries Association, 2007 ed., available from 〈www.itrs.net〉 (2007).
    • (2007) ITRS Roadmap, Interconnect
  • 4
    • 0032620394 scopus 로고    scopus 로고
    • J. M. E. Harper, C. Cabral. Jr., P. G. Andricacos, L. Gignac, I. C. Noyan, K. P. Rodbell, and C. K. Hu, J. Appl. Phys., 86, 2516-2525 (1999).
    • J. M. E. Harper, C. Cabral. Jr., P. G. Andricacos, L. Gignac, I. C. Noyan, K. P. Rodbell, and C. K. Hu, J. Appl. Phys., 86, 2516-2525 (1999).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.