Imaging and spectroscopy of defect luminescence and electron-phonon coupling in single SiO2 nanoparticles

Nano Letters

Volumn 9, Issue 9, 2009, Pages 3239-3244

  Chizhik, Anna M ^a   Chizhik, Alexey I ^a   Gutbrod, Raphael ^a   Meixner, Alfred Johann ^a   Schmidt, Torsten ^b   Sommerfeld, Jana ^b   Huisken, Friedrich ^b  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON-ION LASER; CONFOCAL MICROSCOPES; DEFECT LUMINESCENCE; DOUBLE PEAK; DYNAMICAL EFFECTS; ELECTRON PHONON COUPLINGS; FLUORESCENCE INTERMITTENCY; HIGHER ORDER; LASER PYROLYSIS; LINEAR TRANSITIONS; LONGITUDINAL OPTICAL PHONONS; LOW CONCENTRATIONS; NANO POWDERS; PHONON BANDS; POLARIZED DOUGHNUT MODES; SILICON NANOCRYSTALS; SPECTRAL ANALYSIS; THIN POLYMER LAYERS; THREE-DIMENSIONAL ORIENTATION; TRANSITION DIPOLE MOMENTS; ZERO-PHONON LINE;

ARGON; DIPOLE MOMENT; ELECTRIC DIPOLE MOMENTS; LASER EXCITATION; LASERS; MOLECULAR VIBRATIONS; NANOPARTICLES; OXIDE MINERALS; PHONONS; QUARTZ; SILICON COMPOUNDS; SPECTRUM ANALYSIS; SPECTRUM ANALYZERS;

SILICON OXIDES;

ARGON; NANOMATERIAL; SILICON DIOXIDE;

ARTICLE; CHEMISTRY; CONFOCAL MICROSCOPY; ELECTRON; LASER; LUMINESCENCE; MATERIALS TESTING; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY;

ARGON; ELECTRONS; LASERS; LUMINESCENCE; MATERIALS TESTING; MICROSCOPY, CONFOCAL; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SILICON DIOXIDE; SURFACE PROPERTIES;

EID: 70349952356     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl901509k     Document Type: Article

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