Polychromatic microdiffraction analysis of defect self-organization in shock deformed single crystals

International Journal of Plasticity

Volumn 25, Issue 11, 2009, Pages 2081-2093

  Barabash, R I ^a,b   Ice, G E ^a   Kumar, M ^c   Ilavsky, J ^d   Belak, J ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Tennessee   (United States)

^c LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Dynamic fracture; Nondestructive evaluation; Shock waves; Stress relaxation; Voids and inclusions

Indexed keywords

3D RESOLUTION; DISLOCATION DENSITIES; DYNAMIC FRACTURE; EFFECTIVE STRAIN; GEOMETRICALLY NECESSARY DISLOCATIONS; LAUE PATTERNS; MESOSCALE; MICRODIFFRACTIONS; NONDESTRUCTIVE EVALUATION; SELF-ORGANIZATIONS; SEM; SHOCKED MATERIAL; SPATIALLY RESOLVED X-RAY DIFFRACTIONS; STRAIN GRADIENTS; SUBMICRON; VOIDS AND INCLUSIONS; WHITE BEAMS;

DIFFRACTION; DISLOCATIONS (CRYSTALS); FRACTURE; IMAGE SEGMENTATION; RESIDUAL STRESSES; SHOCK WAVES; STRESS RELAXATION; SURFACES; X RAY DIFFRACTION ANALYSIS;

SINGLE CRYSTALS;

EID: 70349762905     PISSN: 07496419     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijplas.2009.01.002     Document Type: Article

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