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1
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24644433994
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Fabrication of nanowire anisotropic conductive film for ultra-fine pitch flip chip interconnection
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Florida, USA, May 31 - June 3
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th Electronic Components and Technology Conference, Florida, USA, May 31 - June 3, 2005, pp. 66-70.
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(2005)
th Electronic Components and Technology Conference
, pp. 66-70
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Lin, R.-J.1
Hsu, Y.-Y.2
Chen, Y.-C.3
Cheng, S.-Y.4
Uang, R.-H.5
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2
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14744271450
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Wafer-level microbumping for flip chips
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Souriau, J.-C" Brun, J" Franiatte, R" Mathieu, L" Ponthenier, G" Sillon, N" "Wafer-level Microbumping for Flip Chips", Advanced Packaging, Vol.14, No.2 (2005), pp. 20-22.
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Advanced Packaging
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Souriau, J.-C.1
Brun, J.2
Franiatte, R.3
Mathieu, L.4
Ponthenier, G.5
Sillon, N.6
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3
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0033326193
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Mechanisms underlying the unstable contact resistance of conductive adhesives
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Lu, D" Tong, Q.K" Wong C.P" "Mechanisms Underlying the Unstable Contact Resistance of Conductive Adhesives", IEEE Transactions on Electronics Packaging Manufacturing, Vol.22, No.3 (1999), pp. 228-232.
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Lu, D.1
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Wong, C.P.3
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4
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0034478736
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Feasibility of surface activated bonding for ultra-fine pitch interconnection - A new concept of bump-less direct bonding for system level packaging
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Nevada, USA, May 21-24
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th Electronic Components and Technology Conference, Nevada, USA, May 21-24, 2000, pp. 702-705.
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(2000)
th Electronic Components and Technology Conference
, pp. 702-705
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Suga, T.1
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5
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0036287839
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Research on the interfacial reaction between anisotropically conductive film and bumpless die
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San Diego, California, USA, May 28-31
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nd Electronic Components and Technology Conference, San Diego, California, USA, May 28-31, 2002, pp. 1569-1574.
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(2002)
nd Electronic Components and Technology Conference
, pp. 1569-1574
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Zhang, J.H.1
Chan, Y.C.2
Zeng, Z.M.3
Chiu, Y.W.4
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6
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22944465424
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Reliability of anisotropic conductive film joints using bumpless chip - Influence of reflow soldering and environmental testing
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June
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Chiang, W.K" Chan, Y.C" "Reliability of Anisotropic Conductive Film Joints Using Bumpless Chip - Influence of Reflow Soldering and Environmental Testing", Journal of Electronic Packaging, Vol.127, June 2005, pp. 113-119.
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(2005)
Journal of Electronic Packaging
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Chiang, W.K.1
Chan, Y.C.2
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7
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42549108567
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Evaluation of metallic nanolawn structures for application in microelectronics packaging
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Dresden, Germany
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Fiedler, S" Zwanzig, M" Schmidt, R" Auerswald, E" Klein, M" Scheel, W" Reichl, H" "Evaluation of Metallic Nanolawn Structures for Application in Microelectronics Packaging", Electronics System Integration Technology Conference, Dresden, Germany, 2006, pp. 886-891.
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(2006)
Electronics System Integration Technology Conference
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Fiedler, S.1
Zwanzig, M.2
Schmidt, R.3
Auerswald, E.4
Klein, M.5
Scheel, W.6
Reichl, H.7
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8
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42749107769
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Evaluation of bondability and reliability of single crystal copper wire bonding
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Shanghai, PR China, June 27 - 30
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Chen, H" Ricky Lee, S.W" Ding, Y. "Evaluation of Bondability and Reliability of Single Crystal Copper Wire Bonding", High Density Microsystem Design and Packaging and Component Failure Analysis Conference (HDP'05), Shanghai, PR China, June 27 - 30, 2005, pp. 1-7.
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(2005)
High Density Microsystem Design and Packaging and Component Failure Analysis Conference (HDP'05)
, pp. 1-7
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Chen, H.1
Ricky Lee, S.W.2
Ding, Y.3
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9
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32044438670
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Reflow and electrical characteristics of nanoscale solder
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2006
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Gu, Z" Ye, H" Smirnova, D" Small, D" Gracias, D.H" "Reflow and Electrical Characteristics of Nanoscale Solder", Small, 2006, 2, No.2 (2006), pp. 225 - 229.
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(2006)
Small
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Gu, Z.1
Ye, H.2
Smirnova, D.3
Small, D.4
Gracias, D.H.5
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10
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32544448834
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The bonding of nanowire assemblies using adhesive and solder
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Gu, Z" Ye, H" Gracias, D.H" "The Bonding of Nanowire Assemblies Using Adhesive and Solder", Journal of Materials, Vol.57, No.12 (2005), pp. 60 - 64.
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(2005)
Journal of Materials
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Gu, Z.1
Ye, H.2
Gracias, D.H.3
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