메뉴 건너뛰기




Volumn , Issue , 2009, Pages 1470-1474

Micro-nano interconnect between gold bond pads and copper nano-wires embedded in a polymer template

Author keywords

[No Author keywords available]

Indexed keywords

3-D INTEGRATION; BOND PAD; COPPER WIRES; ELECTRICAL INSULATION; ELECTRICAL MEASUREMENT; FLIP-CHIP BONDING; GOLD STUD BUMP; METAL WIRES; MICRO-NANO; MICROELECTRONICS PACKAGING; PARALLEL ARRAYS; POLYCARBONATE TEMPLATE; POLYMER TEMPLATES; SUBMICRON; TEST CHIPS;

EID: 70349686460     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2009.5074206     Document Type: Conference Paper
Times cited : (10)

References (10)
  • 3
    • 0033326193 scopus 로고    scopus 로고
    • Mechanisms underlying the unstable contact resistance of conductive adhesives
    • Lu, D" Tong, Q.K" Wong C.P" "Mechanisms Underlying the Unstable Contact Resistance of Conductive Adhesives", IEEE Transactions on Electronics Packaging Manufacturing, Vol.22, No.3 (1999), pp. 228-232.
    • (1999) IEEE Transactions on Electronics Packaging Manufacturing , vol.22 , Issue.3 , pp. 228-232
    • Lu, D.1    Tong, Q.K.2    Wong, C.P.3
  • 4
    • 0034478736 scopus 로고    scopus 로고
    • Feasibility of surface activated bonding for ultra-fine pitch interconnection - A new concept of bump-less direct bonding for system level packaging
    • Nevada, USA, May 21-24
    • th Electronic Components and Technology Conference, Nevada, USA, May 21-24, 2000, pp. 702-705.
    • (2000) th Electronic Components and Technology Conference , pp. 702-705
    • Suga, T.1
  • 6
    • 22944465424 scopus 로고    scopus 로고
    • Reliability of anisotropic conductive film joints using bumpless chip - Influence of reflow soldering and environmental testing
    • June
    • Chiang, W.K" Chan, Y.C" "Reliability of Anisotropic Conductive Film Joints Using Bumpless Chip - Influence of Reflow Soldering and Environmental Testing", Journal of Electronic Packaging, Vol.127, June 2005, pp. 113-119.
    • (2005) Journal of Electronic Packaging , vol.127 , pp. 113-119
    • Chiang, W.K.1    Chan, Y.C.2
  • 9
    • 32044438670 scopus 로고    scopus 로고
    • Reflow and electrical characteristics of nanoscale solder
    • 2006
    • Gu, Z" Ye, H" Smirnova, D" Small, D" Gracias, D.H" "Reflow and Electrical Characteristics of Nanoscale Solder", Small, 2006, 2, No.2 (2006), pp. 225 - 229.
    • (2006) Small , vol.2 , Issue.2 , pp. 225-229
    • Gu, Z.1    Ye, H.2    Smirnova, D.3    Small, D.4    Gracias, D.H.5
  • 10
    • 32544448834 scopus 로고    scopus 로고
    • The bonding of nanowire assemblies using adhesive and solder
    • Gu, Z" Ye, H" Gracias, D.H" "The Bonding of Nanowire Assemblies Using Adhesive and Solder", Journal of Materials, Vol.57, No.12 (2005), pp. 60 - 64.
    • (2005) Journal of Materials , vol.57 , Issue.12 , pp. 60-64
    • Gu, Z.1    Ye, H.2    Gracias, D.H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.