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Volumn 80, Issue 9, 2009, Pages

A Seeman-Bohlin geometry for high-resolution nanosecond x-ray diffraction measurements from shocked polycrystalline and amorphous materials

(8) Milathianaki, D a,b Hawreliak, J a McNaney, J M a El Dasher, B S a Saculla, M D a Swift, D C a Lorenzana, H E a Ditmire, T b

a LAWRENCE LIVERMORE NATIONAL LABORATORY (United States)

b UNIVERSITY OF TEXAS AT AUSTIN (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR RESOLUTION; CU FOIL; DOPPLER VELOCIMETRY; HIGH ENERGY; HIGH RESOLUTION; IN-SITU; LATTICE PLANE; MULTI-BEAM; POLYCRYSTALLINE; SHOCK HUGONIOT; SPECTRAL BROADENING; STATIC CONDITIONS; TIME-RESOLVED X-RAY DIFFRACTION; X-RAY DIFFRACTION MEASUREMENTS; X-RAY SOURCES;

DIFFRACTION; POLYCRYSTALLINE MATERIALS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

AMORPHOUS MATERIALS;

EID: 70349678885 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3230647 Document Type: Article

Times cited : (4)

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