An analysis of fault effects and propagations in AVR microcontroller atmega103(l)

Proceedings - International Conference on Availability, Reliability and Security, ARES 2009

Volumn , Issue , 2009, Pages 166-172

  Rohani, Alireza ^a   Zarandi, Hamid R ^a,b  

^a AMIRKABIR UNIVERSITY OF TECHNOLOGY   (Iran)

^b INSTITUTE FOR STUDIES IN THEORETICAL PHYSICS AND MATHEMATICS IPM   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

AVR MICROCONTROLLERS; FAULT EFFECT; FAULT INJECTION; FAULT-TOLERANT; MAIN COMPONENT; SIMULATION TIME; SIMULATION-BASED; TRANSIENT FAULTS; VHDL LANGUAGE;

COMPUTER HARDWARE DESCRIPTION LANGUAGES; MICROCONTROLLERS; SOFTWARE TESTING;

CONTROLLERS;

EID: 70349669586     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARES.2009.169     Document Type: Conference Paper

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