Experimental study of plasmonic structures with variant periods for sub-wavelength focusing: Analyses of characterization errors

Journal of Modern Optics

Volumn 56, Issue 14, 2009, Pages 1550-1556

  Fu, Yongqi ^a,b   Mote, Rakesh G ^b   Wang, Qian ^c   Zhou, Wei ^b  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

FIB fabrication; NSOM; Plasmonic structures; SPP wave

Indexed keywords

BEAM SPOT SIZE; COMPUTATIONAL RESULTS; DIRECT MEASUREMENT; DIRECT MILLING; EXPERIMENTAL STUDIES; FABRICATION PROCESS; FIB FABRICATION; FOCUSING FUNCTION; NANOFABRICATION; NEAR-FIELD SCANNING OPTICAL MICROSCOPE; NSOM; OPTICAL CHARACTERIZATION; PLASMONIC STRUCTURES; SPP WAVE; SUB-WAVELENGTH;

ERRORS; FABRICATION; FOCUSED ION BEAMS; PHOTORESISTS; PLASMONS; SURFACE PLASMON RESONANCE;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 70349603820     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500340903180566     Document Type: Article

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