Investigation of physical properties of quartz after focused ion beam bombardment

Applied Physics B: Lasers and Optics

Volumn 80, Issue 4-5, 2005, Pages 581-585

  Fu, Yongqi ^a,b   Bryan, N K A ^a,b  

^a Singapore Massachusetts Inst T   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; GLASS; ION BOMBARDMENT; OPTICAL COMMUNICATION; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY;

FULL WIDTH HALF MAXIMUM (FWHM); ION BEAM BOMBARDMENT; NEAR INFRARED QUARTZ; OPTICAL APPLICATIONS;

QUARTZ;

EID: 17444376832     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-005-1746-0     Document Type: Article

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