Reliable hot-spot classification in 10 ms using ultra-fast lock-in thermography

Progress in Photovoltaics: Research and Applications

Volumn 17, Issue 7, 2009, Pages 441-450

  Kasemann, Martin ^a   Walter, Benjamin ^a,b   Warta, Wilhelm ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^b WSL INSTITUTE FOR SNOW AND AVALANCHE RESEARCH SLF   (Switzerland)

Author keywords

Characterization; Hot spot; Lock in thermography

Indexed keywords

AUTOMATED EVALUATION; HOT-SPOT; HOTSPOTS; LOCAL HEAT; LOCK-IN THERMOGRAPHY; MATERIAL COMPOSITIONS; MEASUREMENT PRINCIPLE; MEASUREMENT TECHNIQUES; MEASUREMENT TIME; NON DESTRUCTIVE; QUANTITATIVE IMAGES; SPATIALLY RESOLVED; STEP-BY-STEP; THIN-FILM SOLAR CELLS; ULTRA-FAST;

CELL MEMBRANES; PHOTOVOLTAIC CELLS; REMOTE SENSING; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SOLAR CELLS; THERMOGRAPHY (IMAGING);

THERMOGRAPHY (TEMPERATURE MEASUREMENT);

EID: 70349559476     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.901     Document Type: Article

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